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256Mb, 512Mb, 1Gb, 2Gb: 3V Embedded Parallel NOR Flash
Absolute Ratings and Operating Conditions
Absolute Ratings and Operating Conditions
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other condi-
tions outside those indicated in the operational sections of this specification is not im-
plied. Exposure to absolute maximum rating conditions for extended periods may ad-
versely affect reliability.
Table 24: Absolute Maximum/Minimum Ratings
Parameter
Temperature under bias
Storage temperature
Input/output voltage
Supply voltage
Input/output supply voltage
Program voltage
Symbol
T BIAS
T STG
V IO
V CC
V CCQ
V PPH
Min
–50
–65
–0.6
–0.6
–0.6
–0.6
Max
125
150
V CC + 0.6
4
4
14.5
Unit
°C
°C
V
V
V
V
Notes
1, 2
3
Notes:
1. During signal transitions, minimum voltage may undershoot to ?2V for periods less than
20ns.
2. During signal transitions, maximum voltage may overshoot to V CC + 2V for periods less
than 20ns.
3. V PPH must not remain at 12V for more than 80 hours cumulative.
Table 25: Operating Conditions
Parameter
Supply voltage
Input/output supply voltage (V CCQ ≤ V CC )
Program voltage
Ambient operating temperature
Load capacitance
Input rise and fall times
Input pulse voltages
Input and output timing reference voltages
Symbol
V CC
V CCQ
V PP
T A
C L
–
–
–
Min
2.7
1.65
–2.0
–40
–
30
0 to V CCQ
V CCQ /2
Max
3.6
3.6
12.5
85
10
Unit
V
V
V
°C
pF
ns
V
V
PDF: 09005aef849b4b09
m29ew_256mb_2gb.pdf - Rev. B 8/12 EN
55
Micron Technology, Inc. reserves the right to change products or specifications without notice.
? 2012 Micron Technology, Inc. All rights reserved.
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